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semiconductor wafer material News
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Silicon Carbide Crystal (SiC)
GaN substrate
AlN on Sapphire Substrate
GaAs crystal
Germanium substrate
CZT
Semiconductor Materials
Silicon Carbide Wafers
GaAs Wafer
Ge(Germanium) Single Crystals and Wafers
CdZnTe (CZT) Wafer
III-V Nitrides Wafer
GaN Wafer
Silicon Carbide Crystal (SiC)
GaN substrate
AlN on Sapphire Substrate
GaAs crystal
Germanium substrate
CZT
Semiconductor Materials
Silicon Carbide Wafers
GaAs Wafer
Ge(Germanium) Single Crystals and Wafers
CdZnTe (CZT) Wafer
III-V Nitrides Wafer
GaN Wafer

News

  • 2013-09-17 07:40:19Hybrid pixel-waveform CdTe/CZT detector for use in an ultrahigh resolution MRI compatible SPECT system
  • 2013-09-17 07:31:32Effects of oxidation curing and Al atoms on the formation of near-stoichiometric freestanding SiC(Al) films derived from polyaluminocarbosilane (PACS)
  • 2013-09-16 09:26:22Preparation and characterization of a dual-layer carbon film on 6H-SiC wafer using carbide-derived carbon process with subsequent chemical vapor deposition
  • 2013-09-13 03:24:20Series resistance study of Schottky diodes developed on 4H-SiC wafers using a contact of titanium or molybdenum
  • 2013-09-12 07:46:55Hierarchical Porous Patterns of n-type 6H–SiC Crystals via Photo-electrochemical Etching
  • 2013-09-11 07:23:45Liquid polycarbosilane derived SiC coating on silicon (1 1 1) wafer for enhanced mechanical properties
  • 2013-09-10 02:48:41Quality improvement of single crystal 4H SiC grown with a purified β-SiC powder source
  • 2013-09-09 02:32:27Nanogrinding of SiC wafers with high flatness and low subsurface damage
  • 2013-09-06 02:19:31Application of 1200V-8A SiC JBS Diodes in the Motor System
  • 2013-09-05 03:43:57Deep Levels in Electron-Irradiated n- and p-type 4H-SiC Investigated by Deep Level Transient Spectroscopy
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