News

2019-12-30 06:28:50Effects of Cadmium Impurities on the Electrowinning of Zinc
2019-12-25 01:11:04300 mm SiGe-On-Insulator Substrates with High Ge Content (70%) Fabricated Using the Smart Cut™ Technology
2019-12-16 02:05:31Monolithic CMOS-compatible AlGaInP visible LED arrays on silicon on lattice-engineered substrates (SOLES)
2019-12-09 06:58:47Anisotropy of single-crystal 3C–SiC during nanometric cutting
2019-12-02 08:16:13Dependence of the Surface, the Structural, and the Optical Properties on the Thickness of the AIN Buffer Layer for GaN Epilayers Grown on Sapphire Substrates
2019-11-25 02:08:09Influence of cadmium on blood and hair trace elements and biochemical markers
2019-11-18 01:16:01Growth and structure evaluation of strain-relaxed Ge1−xSnx buffer layers grown on various types of substrates
2019-11-11 06:16:13Monolithic integration of Si-MOSFET and GaN-LED using Si/SiO2/GaN-LED wafe
2019-11-05 07:45:54Determination of the transport properties in 4H-SiC wafers by Raman scattering measurement*
2019-10-29 01:24:43Design and fabrication of high performance wafer-level vacuum packaging based on glass–silicon–glass bonding techniques