News

2016-03-10 08:05:49Spintronics advance brings wafer-scale quantum devices closer to reality
2016-02-03 02:22:45Ultraviolet photoresponse of ZnO nanostructured AlGaN/GaN HEMTs
2016-02-03 02:19:25Full wafer scale nanoimprint lithography for GaN-based light-emitting diodes
2016-01-20 06:07:05Chromium compensated gallium arsenide detectors for X-ray and γ-ray spectroscopic imaging
2016-01-04 09:08:26Properties of GaN layers grown on N-face free-standing GaN substrates
2015-12-24 02:19:42Epitaxial growth of SiC in a single and a multi wafer vertical CVD system: a comparison.
2015-12-18 02:21:13Impact of dielectric parameters on the reflectivity of 3C–SiC wafers with a rough surface morphology in the reststrahlen region
2015-12-11 02:53:51Barrier controlled carrier trapping of extended defects in CdZnTe detector
2015-12-03 02:29:02Determination of the thickness distribution of a graphene layer grown on a 2″ SiC wafer by means of Auger electron spectroscopy depth profiling
2015-11-25 07:07:035 – Low-temperature grown Gallium Arsenide (LT-GaAs) high-speed detectors